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From SIMION

This page contains formal documentation and published works on SIMION. See also Links for less formal resources on the web.

Table of contents

1 General Documentation, Product Literature, Courses 2 HOW-TOs 3 SIS Application Notes 4 Published Papers, Articles, and Preprints

General Documentation, Product Literature, Courses

• [1] (http://www.simion.com/docs/faq.html) Frequently Asked Questions (FAQ)
• [2] (http://www.simion.com/docs/simion_brochure.pdf) SIMION Brochure (6-page PDF)
• [3] (http://www.simion.com/docs/demo.html) A Tour of the SIMION 7.0 Demo
• [4] (http://www.simion.com/docs/manual/) SIMION Manual (table of contents and sample chapter)
• [5] (http://www.simion.com/docs/asms_course.html) SIMION Course Notes (from ASMS)
• [6] (http://hipirms.org) "Introduction to Inorganic Isotope Ratio Mass Spectrometry" - online course notes and SIMION models (B. Olszweski, T. Appelhans, G. Hieftje, 2007)

HOW-TOs

• [7] (http://www.simion.com/docs/solenoid.html) Importing a solenoid magnetic field into SIMION by multiple methods - 2005-06
• [8] (http://www.simion.com/sl/tools_tut.html) SL Tools Tutorial: Importing/Exporting PA Files--Describing the import of CAD models into SIMION, plus other potential array manipulation capabilities of the new "patools.exe" program soon to be available in the new SL v. 1.1. - 2004
• [9] (http://www.simion.com/sl/editor_tut.html) Editing SIMION Text Files--Emacs and VIM configuration - 2004
• [10] (http://www.simion.com/sl/libraries_tut.html) Manipulating SIMION Potential Arrays Programmatically - D. Manura, 2003
• [11] (http://www.simion.com/sl/field_article.html) Exporting Electrostatic and Magnetic Field Data from SIMION (and Importing it too) - D. Manura, 2004
• [12] (http://www.simion.com/docs/linux.html) Using SIMION under Linux

See also SIMION Info

SIS Application Notes

• [13] (http://www.sisweb.com/referenc/applnote/app-86.htm)Simulation of a Unique Cylindrical Quadrupole Mass Analyzer Using SIMION 7.0. [86]
• [14] (http://www.sisweb.com/referenc/applnote/app-74.htm)Examination of Source Design in Electrospray-TOF Using SIMION 3D [74]
• [15] (http://www.sisweb.com/referenc/applnote/app-70.htm)A Revisitation of the Finkelstein Ion Source using SIMION 3D - Part II [70]
• [16] (http://www.sisweb.com/referenc/applnote/app-69.htm)Application of SIMION 6.0 to the Study of Finkelstein - Part I (EAS 97) [69]
• [17] (http://www.sisweb.com/referenc/applnote/app-59.htm)Experimental Results and SIMION 3D Modeling of the Effects of Grids in TOF Mass Spectrometry (ASMS 97) [59]
• [18] (http://www.sisweb.com/referenc/applnote/app-53.htm)SIMION 3D v6.0 Ion Optics Simulation Software (AVS 96) [53]
• [19] (http://www.sisweb.com/referenc/applnote/app-52.htm)Computer Modeling of Ion Optics in Time-of-Flight Mass Spectrometry Using SIMION 3D (EAS 96) [52]
• [20] (http://www.sisweb.com/referenc/applnote/app-47.htm)The Application of SIMION 6.0 to Problems in Time-of-Flight Mass Spectrometry (ASMS 96) [47]
• [21] (http://www.sisweb.com/referenc/applnote/app-46.htm)Delayed extraction and Laser Desorption: Time-lag Focusing and Beyond (ASMS 96) [46]
• [22] (http://www.sisweb.com/referenc/applnote/app-45.htm)Application of SIMION 6.0 to Filament Design for Mass Spectrometer Ionization Sources (ASMS 96) [45]

Published Papers, Articles, and Preprints

This list of articles and papers on SIMION is far from complete. If you find other references or wish to have an article you published included, please contact us. Published papers on SIMION may be referenced as follows:

D. A. Dahl, "SIMION for the personal computer in reflection," Int. J. Mass Spectrom. 200 (2000) 3. (source: Scientific Instrument Services, Inc., Ringoes, NJ, www.simion.com).

• Note: Many additional papers, not in this list, may be found by searching "SIMION" at these sites:
  • ScienceDirect (http://www.sciencedirect.com) - search for "SIMION" in "Title, abstract, keywords"
  • IOP Electronic Journals (http://www.iop.org/EJ/search/) - search for "SIMION" in "full text"
  • These are also SIMION-related-papers from Google Scholar (http://scholar.google.com), AIP (http://scitation.aip.org/jhtml/scitation/search/), Wiley InterScience (http://www.interscience.wiley.com), Taylor&Francis?, Springer (http://www.springer.com), in particular, JapJAP, JVST (http://scitation.aip.org/jvst/) A and B, BraJP, etc.

• [23] (http://dx.doi.org/10.1063/1.2868781) L. Moreschini, G. Ghiringhelli, K. Larsson, U. Veit, and N. B. Brookes. "A time-of-flight–Mott apparatus for soft x-ray spin resolved photoemission on solid samples." Rev. Sci. Instrum. 79, 033905 (2008) -- uses SIMION to determine TOF dimensions and voltages in TOF-Mott instrument.
• [24] (http://dx.doi.org/10.1016/j.nima.2007.01.051) Omer Sise, Melike Ulua and Mevlut Dogana. "Aberration coefficients of multi-element cylindrical electrostatic lens systems for charged particle beam applications" Nucl. Instrum. Meth. A 573/3 (2007) 329-339
• [25] (http://dx.doi.org/10.1016/j.radphyschem.2005.11.037) Omer Sise, Melike Ulua and Mevlut Dogan. "Characterization and modeling of multi-element electrostatic lens systems" Rad. Phys. Chem. 76/3 (2007), 593-598
• [26] (http://dx.doi.org/10.1051/epjap:2006121) Bernheim M. Evaluation of aberrations of immersion objective lenses in relation to electron emission microscopy. Eur. Phys. J. Appl. Phys. 36, 193-204 (2006)
• [27] (http://dx.doi.org/10.1016/j.ultramic.2005.11.007) Bernheim M. Image acquisition with immersion objective lenses using electrons emitted with several tenths of an electron volt energies: Towards high spatial resolution ESCA analysis. Ultramicroscopy 106 (2006) 398-412
• [28] (http://dx.doi.org/10.1016/j.ijms.2006.08.005) T.J.M. Zouros, Omer Sise, F.M. Spiegelhalder, and David J. Manura. Investigation of the accuracy of ion optics simulations using Kepler orbits in a spherical capacitor. International Journal of Mass Spectrometry. Volume 261, Issues 2-3, 15 March 2007, Pages 115-133.
• [29] (http://www.simion.com/virtual_device/koltsov_prague_2006.pdf) Koltsov S., Walther C. Application of electrospray mass-spectrometry for nanoparticle investigations: Simulation of ion movement in a supersonic jet. Institute for Analytical Instrumentation, Russian Academy of Sciences, St. Petersburg, Russian Federation. 17th International Mass Spectrometry Conference, 2006 (poster)
• [30] (http://arxiv.org/abs/physics/0503145) Omer Sise, Melike Ulu, and Mevlut Dogan. Multi-element electrostatic lens systems for focusing and controlling charged particles. Afyon Kocatepe University, Afyon, Turkey. 2005. (preprint)
• [31] (http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TJM-4B76F7Y-H&_user=10&_handle=B-WA-A-A-ZW-MsSAYZW-UUA-AUYZECVADV-AUYVCBVEDV-VAUBWWEZV-ZW-U&_fmt=summary&_coverDate=02%2F21%2F2004&_rdoc=40&_orig=browse&_srch=%23toc%235314%232004%23994809998%23480177!&_cdi=5314&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=2f2fa5be3837bb750d42a7a9ef6ec66b) Veryovkin I.V., Chen Ch.-Y., Calaway W.F., Pellin M.J., Lee T. Computer Simulation of Time-of-Flight Mass Spectrometers: Calculations of Mass Spectra and Spatial Distributions of Ions, Nucl. Instr. and Meth. A, 2004, V. 519, 1-2, P. 345-352
• [32] (http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TJM-4B7199W-K&_user=10&_handle=B-WA-A-A-ZW-MsSAYZW-UUA-AUYZECVADV-AUYVCBVEDV-VAUBWWEZV-ZW-U&_fmt=summary&_coverDate=02%2F21%2F2004&_rdoc=42&_orig=browse&_srch=%23toc%235314%232004%23994809998%23480177!&_cdi=5314&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=13ab4f5ba06cc5b9e49c54d827864ac0) Veryovkin I.V., Calaway W.F., Pellin M.J. A Virtual Reality Instrument: Near-Future Perspective of Computer Simulations of Ion Optics, Nucl. Instr. and Meth. A, 2004, V. 519, 1-2, P. 363-372
• [33] (http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TJM-4B7199W-D&_user=10&_handle=B-WA-A-A-ZW-MsSAYZW-UUA-AUYZECVADV-AUYVCBVEDV-VAUBWWEZV-ZW-U&_fmt=summary&_coverDate=02%2F21%2F2004&_rdoc=41&_orig=browse&_srch=%23toc%235314%232004%23994809998%23480177!&_cdi=5314&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=d27762bbcb67159192df59145dcf53ed) Veryovkin I.V., Calaway W.F., Pellin M.J. Ion Optics of a New Time-Of-Flight Mass Spectrometer For Quantitative Surface Analysis, Nucl. Instr. and Meth. A, 2004 V. 519, 1-2, P. 353-362
• [34] (http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TJN-4BRKXPB-16&_user=10&_handle=B-WA-A-A-AEZ-MsSAYZA-UUW-AUYZEYCZUZ-AUYVCZZVUZ-VAAVBBYWY-AEZ-U&_fmt=summary&_coverDate=06%2F30%2F2004&_rdoc=88&_orig=browse&_srch=%23toc%235315%232004%23997809999%23500733!&_cdi=5315&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=1f74a5244abeaa9640e3481797f87f3f) Veryovkin I.V., Calaway W.F., Moore J.F., Pellin M.J., Burnett D.S. A new time-of-flight instrument for quantitative surface analysis, Nucl. Instr. and Meth. B, 2004, V. 219-220, P.473-479
• [35] (http://www.nature.com/nmat/thismonth/0504-1.html) Saf, R., Goriup, M., Steindl, T., Hamedinger, T., Sandholzer, D., Hayn, G., "Thin organic films by atmospheric-pressure ion deposition", Nature Materials, 3, 323-329 (2004). doi:10.1038/nmat117 --Contains results of SIMION simulations.
• [36] (http://www.ensc.sfu.ca/users/whitmore/public_html/courses/thesis/Le%20Du%20Thesis%20Example.pdf) Karine Marie Galle Le Du, Modeling of an Extraction Lens System for H- Volume Cusp Ion Sources Used to Inject Beam into Commercial Cycltrons. BS Thesis, Simon Fraser Univerisity, Mar 2003
• [37] (http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=173723) I. Konvalina and I. Mullerova. Efficiency of Collection of the Secondary Electrons in SEM. Microsc. Microanal. Vol.9 (suppl.3) 108 (2003)
• [38] (http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=173751) R. Autrata, J. Jirak, L. Schneider. Usage of Segmental Ionization Detector in Environmental Conditions Microsc. Microanal. Vol 9 (suppl. 3) 142 (2003).
• [39] (http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6VND-45H99WM-2&_user=10&_handle=B-WA-A-A-Y-MsSAYZW-UUW-AUYZWUCEUA-AUYBDYZDUA-BEVVWUVZB-Y-U&_fmt=summary&_coverDate=05%2F15%2F2002&_rdoc=5&_orig=browse&_srch=%23toc%236176%232002%23997839996%23319717!&_cdi=6176&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=18270ce4ff5524f02b99e406d097a096) A. Appelhans and D. Dahl. Measurement of external ion injection and trapping efficiency in the ion trap mass spectrometer and comparison with a predictive model." International Journal of Mass Spectrometry. Volume 216, Issue 3, 15 May 2002, pp. 269-284. -- A comparison of real quadrupole ion trap injection and trapping efficiencies against SIMION simulations results using SIMION user programs to simulate the hard-sphere collision model for Helium gas.
• A. W. Bigelow,a) G. Randers-Pehrson, and D. J. Brenner. [40] (http://www.columbia.edu/~ab1260/papers/lis.pdf) Laser ion source development for the Columbia University microbeam. Review of Scientific Instruments. Volume 73, Number 2 February 2002
• [41] (http://wwwsoc.nii.ac.jp/jsac/analsci/ICAS2001/pdfs/0600/0625_3g06n2.pdf) Y. Shibata et al. GC-AMS Program at NIES-TERRA. Analytical Sciences 2001, Vol. 17 Supplement.
• [42] (http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6VND-41YG786-2&_user=10&_handle=B-WA-A-A-BD-MsSAYZA-UUW-AUYZAEUEYU-AUYBDDADYU-BEBYWVCYU-BD-U&_fmt=summary&_coverDate=12%2F25%2F2000&_rdoc=2&_orig=browse&_srch=%23toc%236176%232000%23997999998%23222963!&_cdi=6176&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=dad1b53ce4a7b7ae1b46d6dafaf92376) D. A. Dahl, "SIMION for the personal computer in reflection", Int. J. Mass Spectrom. 200 (2000) 3-25. (Abstract: origins, history, and capabilities of SIMION (versions 2.0-7.0) from the author's perspective.)
• Veryovkin I.V., Calaway W.F., Pellin M.J. Three-dimensional modeling of a time-of-flight mass spectrometer: optimisation of SNMS/SIMS transmission using SIMION in "Secondary Ion Mass Spectrometry. SIMS XII, 2000, Elsevier, P.337-340. - this paper D. Dahl cited in his 2000 Int. J. Mass Spectrom. article
• [43] (http://www.impub.co.uk/abs/EMS06_0289.html) R. Pikver, J. Past, J. Subbi, R. Aguraiuja and E. Lippmaa. Some practical aspects of the acceleration-deceleration method for ion kinetic energy focusing in matrix-assisted laser desorption/ionization Fourier transform ion cyclotron resonance mass spectrometry. Eur. J. Mass Spectrom. 6, 289 - 297 (2000)
• [44] (http://www.spectroscopynow.com/Spy/pdfs/JMS341219.pdf) "Simulation of Ion Trajectories in a Quadrupole Ion Trap: A Comparison of Three Simulation Programs," M. W. Forbes, M. Sharifi,T. Croley, Z. Lausevic and R. E. March. J. Mass Spectrom. 34, 12191239 (1999).
• [45] (http://dx.doi.org/10.1051/epjap:1999173) F. Vurpillot - A. Bostel - A. Menand - D. Blavette. Trajectories of field emitted ions in 3D atom-probe. Eur. Phys. J. AP 6, 217-221.
• [46] (http://www.inel.gov/featurestories/7-98dahl.shtml) Instrument Simulators Determine Design: Envisioning Ions with SIMION. INEEL, 1998. (history, applications, about the author--short, high-level)
• [47] (http://arxiv.org/PS_cache/physics/pdf/9811/9811028.pdf) D. Ferenc, D. Hrupec, and E. Lorenz. Solution to the ion feedback problem in Hybrid Photon Detectors and Photo Multiplier Tubes. arXiv:physics/9811028 v1 16 Nov 1998.
• [48] (http://www3.interscience.wiley.com/cgi-bin/abstract/61007447/ABSTRACT) S. Daolio, B. Facchin, C. Pagura, A. Tolstogouzov, N. Konenkov. Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions. 1998 --"The [quadrupole secondary ion mass spectrometer] was modeled using the SIMION 3D program before building the prototype."
• [49] (http://arxiv.org/PS_cache/physics/pdf/9810/9810004.pdf) Daniel Ferenc, New Developments in Hybrid Photon Detectors. Oct 1998.
• D. Dahl. "SIMION 3D Version 6.0". 43ed ASMS Conference on Mass Spectrometry and Allied Topics, May 21-26 1995, Atlanta, Georgia, pg 717.
• Dahl, D. A.; Delmore, J. E.; Appelhans, A. D. "Simion PC/Ps2 Electrostatic Lens Design Program." Review of Scientific Instruments, 1990, Vol 61(1) pp 607-609.
• Additional papers listed on the HDA (Hemispherical Deflection Analyzer) and Lens pages and in the SIMION 8.0.2/3 examples (README.html files).

See also Links for additional links on SIMION.