SIMION® Industry standard charged particle optics simulation software.
About | Documentation | Community/Support | Downloads | Ordering

Info: Particle Optics Links

From SIMION

A collection of links of general interest to the particle optics community.

Table of contents

System Comparisons

  • Summary of the characteristics of different mass analyzers (http://www.jeol.com/ms/docs/ms_analyzers.html). JEOL. (overview of magentic sectors, quadrupoles, time-of-flight, ion cyclotron resonance, and quadrupole ion traps)
  • Accelerators (http://www.lbl.gov/abc/wallchart/teachersguide/pdf/Chap11.pdf). From Nuclear Science - A Teachers Guide to the Nuclear Science Wall Chart. Contemporary Physics Education Project (CPEP) 2003. (overview of types of particle accelerators: Cockroft-Walton, Van de Graaff, linear, cyclotron, synchrotron, and continuous electron beam)
  • Analytical Techniques (http://www.eaglabs.com/en-US/services/semiconductor.html), Evans Analytical Group (compare SIMS, TOF, SEM, FE-SEM, EDS, AES, XPS, FT-IR, GCMS, ...)

System Overviews

  • Ion Cylclotron Resonance (ICR) / Penning Trap: FT-ICR theory: a brief review (http://www.emsl.pnl.gov/docs/msd/mass_spec/home/fticrtut.html). Advanced Mass Spectrometry and Proteomics Group. 2000.; Fourier Transform Mass Spectrometry (http://dx.doi.org/10.1002/(SICI)1096-9888(199612)31:12%3C1325::AID-JMS453%3E3.3.CO;2-N) I. J. Amster, JMS 31, 1996, 1325-1337.

Chemistry Department.

  • Time-of-Flight (TOF): Time of Flight (TOF) (http://www.chem.ox.ac.uk/spectroscopy/mass-spec/Lecture/oxmain_lectureTOF.html). Mass Spectrometry Facility. Department of Chemistry, University of Oxford

Theory

  • [1] (http://books.google.com/books?id=D48NFxh68IIC) John Moore, Michael A. Coplan, Christopher Davis, Sandra Greer. Building Scientific Apparatus. Published 2002 Westview Press. ISBN 0813340063 -- Online book has a chapter 5 on charged particle optics on basic lens theory
  • Space Charge: Space Charge in Mass Spectrometry (http://www.spectroscopymag.com/spectroscopy/data/articlecolumn/spectroscopy/232004/97167/article.pdf). Ken Busch, Spectroscopy Solutions for Material Analysis, 19, 6, 2004. (high-level introduction)
  • Refraction: Surface and Contact Mechanics: Electron Optics (http://www.siu.edu/~cafs/surface/file4.html) (broken link), David T. Marx, Associate Scientist, Center for Advanced Friction Studies.
  • Electron Optics Calculation: Electric Fields (http://www.simon.kuenzli.name/science/felder.pdf), Bettina Sinzig and Simon Kunzli, Jan 2002.
  • Magnetism Concepts: Fundamental Relationships (http://geophysics.ou.edu/solid_earth/notes/mag_basic/mag_basic.html), School of Geology & Geophysics University of Oklahoma
  • Ion Mobility: Ion Mobility (http://bowers.chem.ucsb.edu/theory_analysis/ion-mobility/index.shtml) - The Bowers Group.

Components

General

For links specific to the SIMION ion optics simulation software, see the SIMION References and Documentation (http://www.simion.com/info/).

Have link suggestions? Let us know below in the box below.

Any comments on this web page? (will be sent to SIS)
[Optional] Your name: email: phone/fax:
(c) 2003-2006 Scientific Instrument Services, Inc. (SIS). Contact SIS.